Instrument name: Electron Probe Microanalyzer
Instrument manufacturer: JEOL
Instrument model: JXA-iSP100
Main technical indicators:
Electron gun type: Tungsten filament
Acceleration voltage: 0.2~30 KV (0.1KV steps)
Probe current range: 1pA~10uA
Analyzable elements: 5B-92U
Application:
During studying elements on or near the surface of solid materials, it has the advantages of being non-destructive, in-situ, and micro-regional, enabling qualitative, quantitative, linear, and areal analysis of materials.
Sample requirements:
The sample should be solid, non-toxic, non-corrosive, non-radioactive, and non-magnetic, with good surface conductivity.
Samples that have a low melting point, decompose, or release gases under electron beam irradiation cannot be tested.
The sample surface should be as flat and clean as possible, with no contamination.
Location: C601, Building C，MUST
Appointment information: Contacts, Mr. Jin; Email address, ljin@must.edu.mo. Please handle the samples before scheduling the test.
