Instrument name: Scanning Electron Microscope
Manufacturer: JEOL
Model: JSM-IT500
Main technical indicators:
Resolution: High vacuum mode 3.0 nm (30 kV) 15.0 nm (1.0 kV); Low vacuum mode: 4.0 nm (30 kV BED)
Image magnification: ×5～×300,000 (128 mm × 96 mm as the display size)
Display magnification: ×14～×839,724
Electron gun type: Tungsten filament
Acceleration voltage: 0.3kV～30kV
Low vacuum pressure range: 10~650Pa
Objective lens aperture: 3 levels with X, Y fine adjustment function
Automatic functions: Filament adjustment, electron gun axis adjustment, focusing, astigmatism, contrast/brightness adjustment
Image modes: Secondary electron image, composition image, morphology image
Pixel count for image acquisition: 640×480，1280×960，2560×1920，5120×3840
Length measurement function: Distance between two points, distance between parallel lines, angle, diameter, etc
Accessories: Energy dispersive spectroscopy (EDS) probe, electron backscatter diffraction (EBSD) probe
Location: C601, Building C，MUST
Appointment information: Contacts, Mr. Jin; Email address, ljin@must.edu.mo. Please process the samples before scheduling the test.
